Modified getOffset for calibrating Thermal Drift coefficients.
Fork of ITG3200 by
Modified to make getOffset() function easier to use.
ITG3200.h@13:e886466d7d67, 2012-11-06 (annotated)
- Committer:
- tylerjw
- Date:
- Tue Nov 06 17:35:14 2012 +0000
- Revision:
- 13:e886466d7d67
- Parent:
- 12:d624e9c6dae7
- Child:
- 14:e4bf80188ba7
int changed to int16_t
Who changed what in which revision?
User | Revision | Line number | New contents of line |
---|---|---|---|
gltest26 | 1:9bef044f45ad | 1 | /** |
gltest26 | 3:eea9733ca427 | 2 | * @file ITG3200.h |
tylerjw | 11:9a354f34d8e3 | 3 | * @author Tyler Weaver |
gltest26 | 1:9bef044f45ad | 4 | * |
gltest26 | 1:9bef044f45ad | 5 | * @section LICENSE |
gltest26 | 1:9bef044f45ad | 6 | * |
gltest26 | 1:9bef044f45ad | 7 | * Copyright (c) 2010 ARM Limited |
gltest26 | 1:9bef044f45ad | 8 | * |
gltest26 | 1:9bef044f45ad | 9 | * Permission is hereby granted, free of charge, to any person obtaining a copy |
gltest26 | 1:9bef044f45ad | 10 | * of this software and associated documentation files (the "Software"), to deal |
gltest26 | 1:9bef044f45ad | 11 | * in the Software without restriction, including without limitation the rights |
gltest26 | 1:9bef044f45ad | 12 | * to use, copy, modify, merge, publish, distribute, sublicense, and/or sell |
gltest26 | 1:9bef044f45ad | 13 | * copies of the Software, and to permit persons to whom the Software is |
gltest26 | 1:9bef044f45ad | 14 | * furnished to do so, subject to the following conditions: |
gltest26 | 1:9bef044f45ad | 15 | * |
gltest26 | 1:9bef044f45ad | 16 | * The above copyright notice and this permission notice shall be included in |
gltest26 | 1:9bef044f45ad | 17 | * all copies or substantial portions of the Software. |
gltest26 | 1:9bef044f45ad | 18 | * |
gltest26 | 1:9bef044f45ad | 19 | * THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR |
gltest26 | 1:9bef044f45ad | 20 | * IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, |
gltest26 | 1:9bef044f45ad | 21 | * FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE |
gltest26 | 1:9bef044f45ad | 22 | * AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER |
gltest26 | 1:9bef044f45ad | 23 | * LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, |
gltest26 | 1:9bef044f45ad | 24 | * OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN |
gltest26 | 1:9bef044f45ad | 25 | * THE SOFTWARE. |
gltest26 | 1:9bef044f45ad | 26 | * |
gltest26 | 1:9bef044f45ad | 27 | * @section DESCRIPTION |
gltest26 | 1:9bef044f45ad | 28 | * |
tylerjw | 11:9a354f34d8e3 | 29 | * Modified version of Aaron Berk's library. |
gltest26 | 1:9bef044f45ad | 30 | * ITG-3200 triple axis, digital interface, gyroscope. |
gltest26 | 3:eea9733ca427 | 31 | * Forked from Aaron Berk's work. |
gltest26 | 1:9bef044f45ad | 32 | * |
gltest26 | 1:9bef044f45ad | 33 | * Datasheet: |
gltest26 | 1:9bef044f45ad | 34 | * |
gltest26 | 1:9bef044f45ad | 35 | * http://invensense.com/mems/gyro/documents/PS-ITG-3200-00-01.4.pdf |
gltest26 | 1:9bef044f45ad | 36 | */ |
gltest26 | 1:9bef044f45ad | 37 | |
gltest26 | 1:9bef044f45ad | 38 | #ifndef ITG3200_H |
gltest26 | 1:9bef044f45ad | 39 | #define ITG3200_H |
gltest26 | 1:9bef044f45ad | 40 | |
gltest26 | 3:eea9733ca427 | 41 | /* |
gltest26 | 1:9bef044f45ad | 42 | * Includes |
gltest26 | 1:9bef044f45ad | 43 | */ |
gltest26 | 1:9bef044f45ad | 44 | #include "mbed.h" |
gltest26 | 1:9bef044f45ad | 45 | |
gltest26 | 3:eea9733ca427 | 46 | /* |
gltest26 | 1:9bef044f45ad | 47 | * Defines |
gltest26 | 1:9bef044f45ad | 48 | */ |
gltest26 | 1:9bef044f45ad | 49 | #define ITG3200_I2C_ADDRESS 0x68 //7-bit address. |
gltest26 | 1:9bef044f45ad | 50 | |
gltest26 | 1:9bef044f45ad | 51 | //----------- |
gltest26 | 1:9bef044f45ad | 52 | // Registers |
gltest26 | 1:9bef044f45ad | 53 | //----------- |
gltest26 | 1:9bef044f45ad | 54 | #define WHO_AM_I_REG 0x00 |
gltest26 | 1:9bef044f45ad | 55 | #define SMPLRT_DIV_REG 0x15 |
gltest26 | 1:9bef044f45ad | 56 | #define DLPF_FS_REG 0x16 |
gltest26 | 1:9bef044f45ad | 57 | #define INT_CFG_REG 0x17 |
gltest26 | 1:9bef044f45ad | 58 | #define INT_STATUS 0x1A |
gltest26 | 1:9bef044f45ad | 59 | #define TEMP_OUT_H_REG 0x1B |
gltest26 | 1:9bef044f45ad | 60 | #define TEMP_OUT_L_REG 0x1C |
gltest26 | 1:9bef044f45ad | 61 | #define GYRO_XOUT_H_REG 0x1D |
gltest26 | 1:9bef044f45ad | 62 | #define GYRO_XOUT_L_REG 0x1E |
gltest26 | 1:9bef044f45ad | 63 | #define GYRO_YOUT_H_REG 0x1F |
gltest26 | 1:9bef044f45ad | 64 | #define GYRO_YOUT_L_REG 0x20 |
gltest26 | 1:9bef044f45ad | 65 | #define GYRO_ZOUT_H_REG 0x21 |
gltest26 | 1:9bef044f45ad | 66 | #define GYRO_ZOUT_L_REG 0x22 |
gltest26 | 1:9bef044f45ad | 67 | #define PWR_MGM_REG 0x3E |
gltest26 | 1:9bef044f45ad | 68 | |
gltest26 | 1:9bef044f45ad | 69 | //---------------------------- |
gltest26 | 1:9bef044f45ad | 70 | // Low Pass Filter Bandwidths |
gltest26 | 1:9bef044f45ad | 71 | //---------------------------- |
gltest26 | 1:9bef044f45ad | 72 | #define LPFBW_256HZ 0x00 |
gltest26 | 1:9bef044f45ad | 73 | #define LPFBW_188HZ 0x01 |
gltest26 | 1:9bef044f45ad | 74 | #define LPFBW_98HZ 0x02 |
gltest26 | 1:9bef044f45ad | 75 | #define LPFBW_42HZ 0x03 |
gltest26 | 1:9bef044f45ad | 76 | #define LPFBW_20HZ 0x04 |
gltest26 | 1:9bef044f45ad | 77 | #define LPFBW_10HZ 0x05 |
gltest26 | 1:9bef044f45ad | 78 | #define LPFBW_5HZ 0x06 |
gltest26 | 1:9bef044f45ad | 79 | |
gltest26 | 1:9bef044f45ad | 80 | // Utility |
gltest26 | 1:9bef044f45ad | 81 | #ifndef M_PI |
gltest26 | 1:9bef044f45ad | 82 | #define M_PI 3.1415926535897932384626433832795 |
gltest26 | 1:9bef044f45ad | 83 | #endif |
gltest26 | 1:9bef044f45ad | 84 | |
gltest26 | 1:9bef044f45ad | 85 | /** |
gltest26 | 1:9bef044f45ad | 86 | * ITG-3200 triple axis digital gyroscope. |
gltest26 | 1:9bef044f45ad | 87 | */ |
gltest26 | 1:9bef044f45ad | 88 | class ITG3200 { |
gltest26 | 1:9bef044f45ad | 89 | |
gltest26 | 1:9bef044f45ad | 90 | public: |
gltest26 | 1:9bef044f45ad | 91 | |
gltest26 | 3:eea9733ca427 | 92 | /** |
gltest26 | 3:eea9733ca427 | 93 | * The I2C address that can be passed directly to i2c object (it's already shifted 1 bit left). |
gltest26 | 3:eea9733ca427 | 94 | * |
gltest26 | 3:eea9733ca427 | 95 | * You don't need to manually set or clear the LSB when calling I2C::read() or I2C::write(), |
gltest26 | 3:eea9733ca427 | 96 | * the library takes care of it. We just always clear the LSB. |
gltest26 | 3:eea9733ca427 | 97 | */ |
gltest26 | 1:9bef044f45ad | 98 | static const int I2C_ADDRESS = 0xD0; |
gltest26 | 9:05396b551a9a | 99 | |
gltest26 | 9:05396b551a9a | 100 | /** |
tylerjw | 12:d624e9c6dae7 | 101 | * @brief Zero offset correction mode that can be specified when calling getXYZ(). |
gltest26 | 9:05396b551a9a | 102 | * |
gltest26 | 9:05396b551a9a | 103 | * The device has a major drift in readings depending on ambient temperature. |
gltest26 | 9:05396b551a9a | 104 | * You can measure the temperature with built-in thermometer to correct it, but you |
gltest26 | 9:05396b551a9a | 105 | * must have calibration curves for each axes to do so. |
gltest26 | 9:05396b551a9a | 106 | * Here are the options on how to correct the drift. |
gltest26 | 9:05396b551a9a | 107 | */ |
gltest26 | 9:05396b551a9a | 108 | enum Correction{ |
gltest26 | 9:05396b551a9a | 109 | NoCorrection, ///< Do not correct zero offset at all; You would have trouble integrating the values to obtain rotation. |
gltest26 | 9:05396b551a9a | 110 | OffsetCorrection, ///< Correct the outputs with single-point zero adjust. |
gltest26 | 9:05396b551a9a | 111 | Calibration, ///< Use calibration curve (actually lines) to correct the outputs. You must provide coefficients with setCalibrationCurve(). |
gltest26 | 9:05396b551a9a | 112 | Num_Correction |
gltest26 | 9:05396b551a9a | 113 | }; |
gltest26 | 1:9bef044f45ad | 114 | |
gltest26 | 1:9bef044f45ad | 115 | /** |
gltest26 | 1:9bef044f45ad | 116 | * Constructor. |
gltest26 | 1:9bef044f45ad | 117 | * |
gltest26 | 1:9bef044f45ad | 118 | * Sets FS_SEL to 0x03 for proper opertaion. |
gltest26 | 1:9bef044f45ad | 119 | * |
gltest26 | 1:9bef044f45ad | 120 | * @param sda - mbed pin to use for the SDA I2C line. |
gltest26 | 1:9bef044f45ad | 121 | * @param scl - mbed pin to use for the SCL I2C line. |
gltest26 | 7:43b936a53b64 | 122 | * @param fastmode Sets the internal I2C interface to use 400kHz clock. |
gltest26 | 1:9bef044f45ad | 123 | */ |
gltest26 | 7:43b936a53b64 | 124 | ITG3200(PinName sda, PinName scl, bool fastmode = false); |
gltest26 | 8:ac0365ab3cef | 125 | |
gltest26 | 8:ac0365ab3cef | 126 | /** |
gltest26 | 8:ac0365ab3cef | 127 | * Constructor that accepts external i2c interface object. |
gltest26 | 8:ac0365ab3cef | 128 | * |
gltest26 | 8:ac0365ab3cef | 129 | * @param i2c The I2C interface object to use. |
gltest26 | 8:ac0365ab3cef | 130 | */ |
gltest26 | 8:ac0365ab3cef | 131 | ITG3200(I2C &i2c) : i2c_(i2c){ |
gltest26 | 8:ac0365ab3cef | 132 | init(); |
gltest26 | 8:ac0365ab3cef | 133 | } |
gltest26 | 8:ac0365ab3cef | 134 | |
gltest26 | 8:ac0365ab3cef | 135 | ~ITG3200(); |
gltest26 | 8:ac0365ab3cef | 136 | |
gltest26 | 8:ac0365ab3cef | 137 | void init(); |
gltest26 | 9:05396b551a9a | 138 | |
gltest26 | 9:05396b551a9a | 139 | /** |
gltest26 | 9:05396b551a9a | 140 | * Sets calibration curve parameters. |
gltest26 | 9:05396b551a9a | 141 | * |
gltest26 | 9:05396b551a9a | 142 | * @param offset An array holding calibration curve offsets (0th-order coefficient) for each axis, must have 3 elements. |
gltest26 | 9:05396b551a9a | 143 | * @param slope An array holding calibration curve slopes (1st-order coefficient) for each axis, must have 3 elements. |
gltest26 | 9:05396b551a9a | 144 | */ |
gltest26 | 9:05396b551a9a | 145 | void setCalibrationCurve(const float offset[3], const float slope[3]); |
gltest26 | 1:9bef044f45ad | 146 | |
gltest26 | 1:9bef044f45ad | 147 | /** |
gltest26 | 1:9bef044f45ad | 148 | * Get the identity of the device. |
gltest26 | 1:9bef044f45ad | 149 | * |
gltest26 | 1:9bef044f45ad | 150 | * @return The contents of the Who Am I register which contains the I2C |
gltest26 | 1:9bef044f45ad | 151 | * address of the device. |
gltest26 | 1:9bef044f45ad | 152 | */ |
gltest26 | 1:9bef044f45ad | 153 | char getWhoAmI(void); |
gltest26 | 1:9bef044f45ad | 154 | |
gltest26 | 1:9bef044f45ad | 155 | /** |
gltest26 | 1:9bef044f45ad | 156 | * Set the address of the device. |
gltest26 | 1:9bef044f45ad | 157 | * |
gltest26 | 1:9bef044f45ad | 158 | * @param address The I2C slave address to write to the Who Am I register |
gltest26 | 1:9bef044f45ad | 159 | * on the device. |
gltest26 | 1:9bef044f45ad | 160 | */ |
gltest26 | 1:9bef044f45ad | 161 | void setWhoAmI(char address); |
gltest26 | 1:9bef044f45ad | 162 | |
gltest26 | 1:9bef044f45ad | 163 | /** |
gltest26 | 1:9bef044f45ad | 164 | * Get the sample rate divider. |
gltest26 | 1:9bef044f45ad | 165 | * |
gltest26 | 1:9bef044f45ad | 166 | * @return The sample rate divider as a number from 0-255. |
gltest26 | 1:9bef044f45ad | 167 | */ |
gltest26 | 1:9bef044f45ad | 168 | char getSampleRateDivider(void); |
gltest26 | 1:9bef044f45ad | 169 | |
gltest26 | 1:9bef044f45ad | 170 | /** |
gltest26 | 1:9bef044f45ad | 171 | * Set the sample rate divider. |
gltest26 | 1:9bef044f45ad | 172 | * |
gltest26 | 1:9bef044f45ad | 173 | * Fsample = Finternal / (divider + 1), where Finternal = 1kHz or 8kHz, |
gltest26 | 1:9bef044f45ad | 174 | * as decidied by the DLPF_FS register. |
gltest26 | 1:9bef044f45ad | 175 | * |
gltest26 | 1:9bef044f45ad | 176 | * @param The sample rate divider as a number from 0-255. |
gltest26 | 1:9bef044f45ad | 177 | */ |
gltest26 | 1:9bef044f45ad | 178 | void setSampleRateDivider(char divider); |
gltest26 | 1:9bef044f45ad | 179 | |
gltest26 | 1:9bef044f45ad | 180 | /** |
gltest26 | 1:9bef044f45ad | 181 | * Get the internal sample rate. |
gltest26 | 1:9bef044f45ad | 182 | * |
gltest26 | 1:9bef044f45ad | 183 | * @return The internal sample rate in kHz - either 1 or 8. |
gltest26 | 1:9bef044f45ad | 184 | */ |
gltest26 | 1:9bef044f45ad | 185 | int getInternalSampleRate(void); |
gltest26 | 1:9bef044f45ad | 186 | |
gltest26 | 1:9bef044f45ad | 187 | /** |
gltest26 | 1:9bef044f45ad | 188 | * Set the low pass filter bandwidth. |
gltest26 | 1:9bef044f45ad | 189 | * |
gltest26 | 1:9bef044f45ad | 190 | * Also used to set the internal sample rate. |
gltest26 | 1:9bef044f45ad | 191 | * Pass the #define bandwidth codes as a parameter. |
gltest26 | 1:9bef044f45ad | 192 | * |
gltest26 | 1:9bef044f45ad | 193 | * 256Hz -> 8kHz internal sample rate. |
gltest26 | 1:9bef044f45ad | 194 | * Everything else -> 1kHz internal rate. |
gltest26 | 1:9bef044f45ad | 195 | * |
gltest26 | 1:9bef044f45ad | 196 | * @param bandwidth Low pass filter bandwidth code |
gltest26 | 1:9bef044f45ad | 197 | */ |
gltest26 | 1:9bef044f45ad | 198 | void setLpBandwidth(char bandwidth); |
gltest26 | 1:9bef044f45ad | 199 | |
gltest26 | 1:9bef044f45ad | 200 | /** |
gltest26 | 1:9bef044f45ad | 201 | * Get the interrupt configuration. |
gltest26 | 1:9bef044f45ad | 202 | * |
gltest26 | 1:9bef044f45ad | 203 | * See datasheet for register contents details. |
gltest26 | 1:9bef044f45ad | 204 | * |
gltest26 | 1:9bef044f45ad | 205 | * 7 6 5 4 |
gltest26 | 1:9bef044f45ad | 206 | * +------+------+--------------+------------------+ |
gltest26 | 1:9bef044f45ad | 207 | * | ACTL | OPEN | LATCH_INT_EN | INT_ANYRD_2CLEAR | |
gltest26 | 1:9bef044f45ad | 208 | * +------+------+--------------+------------------+ |
gltest26 | 1:9bef044f45ad | 209 | * |
gltest26 | 1:9bef044f45ad | 210 | * 3 2 1 0 |
gltest26 | 1:9bef044f45ad | 211 | * +---+------------+------------+---+ |
gltest26 | 1:9bef044f45ad | 212 | * | 0 | ITG_RDY_EN | RAW_RDY_EN | 0 | |
gltest26 | 1:9bef044f45ad | 213 | * +---+------------+------------+---+ |
gltest26 | 1:9bef044f45ad | 214 | * |
gltest26 | 1:9bef044f45ad | 215 | * ACTL Logic level for INT output pin; 1 = active low, 0 = active high. |
gltest26 | 1:9bef044f45ad | 216 | * OPEN Drive type for INT output pin; 1 = open drain, 0 = push-pull. |
gltest26 | 1:9bef044f45ad | 217 | * LATCH_INT_EN Latch mode; 1 = latch until interrupt is cleared, |
gltest26 | 1:9bef044f45ad | 218 | * 0 = 50us pulse. |
gltest26 | 1:9bef044f45ad | 219 | * INT_ANYRD_2CLEAR Latch clear method; 1 = any register read, |
gltest26 | 1:9bef044f45ad | 220 | * 0 = status register read only. |
gltest26 | 1:9bef044f45ad | 221 | * ITG_RDY_EN Enable interrupt when device is ready, |
gltest26 | 1:9bef044f45ad | 222 | * (PLL ready after changing clock source). |
gltest26 | 1:9bef044f45ad | 223 | * RAW_RDY_EN Enable interrupt when data is available. |
gltest26 | 1:9bef044f45ad | 224 | * 0 Bits 1 and 3 of the INT_CFG register should be zero. |
gltest26 | 1:9bef044f45ad | 225 | * |
gltest26 | 1:9bef044f45ad | 226 | * @return the contents of the INT_CFG register. |
gltest26 | 1:9bef044f45ad | 227 | */ |
gltest26 | 1:9bef044f45ad | 228 | char getInterruptConfiguration(void); |
gltest26 | 1:9bef044f45ad | 229 | |
gltest26 | 1:9bef044f45ad | 230 | /** |
gltest26 | 1:9bef044f45ad | 231 | * Set the interrupt configuration. |
gltest26 | 1:9bef044f45ad | 232 | * |
gltest26 | 1:9bef044f45ad | 233 | * See datasheet for configuration byte details. |
gltest26 | 1:9bef044f45ad | 234 | * |
gltest26 | 1:9bef044f45ad | 235 | * 7 6 5 4 |
gltest26 | 1:9bef044f45ad | 236 | * +------+------+--------------+------------------+ |
gltest26 | 1:9bef044f45ad | 237 | * | ACTL | OPEN | LATCH_INT_EN | INT_ANYRD_2CLEAR | |
gltest26 | 1:9bef044f45ad | 238 | * +------+------+--------------+------------------+ |
gltest26 | 1:9bef044f45ad | 239 | * |
gltest26 | 1:9bef044f45ad | 240 | * 3 2 1 0 |
gltest26 | 1:9bef044f45ad | 241 | * +---+------------+------------+---+ |
gltest26 | 1:9bef044f45ad | 242 | * | 0 | ITG_RDY_EN | RAW_RDY_EN | 0 | |
gltest26 | 1:9bef044f45ad | 243 | * +---+------------+------------+---+ |
gltest26 | 1:9bef044f45ad | 244 | * |
gltest26 | 1:9bef044f45ad | 245 | * ACTL Logic level for INT output pin; 1 = active low, 0 = active high. |
gltest26 | 1:9bef044f45ad | 246 | * OPEN Drive type for INT output pin; 1 = open drain, 0 = push-pull. |
gltest26 | 1:9bef044f45ad | 247 | * LATCH_INT_EN Latch mode; 1 = latch until interrupt is cleared, |
gltest26 | 1:9bef044f45ad | 248 | * 0 = 50us pulse. |
gltest26 | 1:9bef044f45ad | 249 | * INT_ANYRD_2CLEAR Latch clear method; 1 = any register read, |
gltest26 | 1:9bef044f45ad | 250 | * 0 = status register read only. |
gltest26 | 1:9bef044f45ad | 251 | * ITG_RDY_EN Enable interrupt when device is ready, |
gltest26 | 1:9bef044f45ad | 252 | * (PLL ready after changing clock source). |
gltest26 | 1:9bef044f45ad | 253 | * RAW_RDY_EN Enable interrupt when data is available. |
gltest26 | 1:9bef044f45ad | 254 | * 0 Bits 1 and 3 of the INT_CFG register should be zero. |
gltest26 | 1:9bef044f45ad | 255 | * |
gltest26 | 1:9bef044f45ad | 256 | * @param config Configuration byte to write to INT_CFG register. |
gltest26 | 1:9bef044f45ad | 257 | */ |
gltest26 | 1:9bef044f45ad | 258 | void setInterruptConfiguration(char config); |
gltest26 | 1:9bef044f45ad | 259 | |
gltest26 | 1:9bef044f45ad | 260 | /** |
gltest26 | 1:9bef044f45ad | 261 | * Check the ITG_RDY bit of the INT_STATUS register. |
gltest26 | 1:9bef044f45ad | 262 | * |
gltest26 | 1:9bef044f45ad | 263 | * @return True if the ITG_RDY bit is set, corresponding to PLL ready, |
gltest26 | 1:9bef044f45ad | 264 | * false if the ITG_RDY bit is not set, corresponding to PLL not |
gltest26 | 1:9bef044f45ad | 265 | * ready. |
gltest26 | 1:9bef044f45ad | 266 | */ |
gltest26 | 1:9bef044f45ad | 267 | bool isPllReady(void); |
gltest26 | 1:9bef044f45ad | 268 | |
gltest26 | 1:9bef044f45ad | 269 | /** |
gltest26 | 1:9bef044f45ad | 270 | * Check the RAW_DATA_RDY bit of the INT_STATUS register. |
gltest26 | 1:9bef044f45ad | 271 | * |
gltest26 | 1:9bef044f45ad | 272 | * @return True if the RAW_DATA_RDY bit is set, corresponding to new data |
gltest26 | 1:9bef044f45ad | 273 | * in the sensor registers, false if the RAW_DATA_RDY bit is not |
gltest26 | 1:9bef044f45ad | 274 | * set, corresponding to no new data yet in the sensor registers. |
gltest26 | 1:9bef044f45ad | 275 | */ |
gltest26 | 1:9bef044f45ad | 276 | bool isRawDataReady(void); |
gltest26 | 1:9bef044f45ad | 277 | |
gltest26 | 1:9bef044f45ad | 278 | /** |
gltest26 | 1:9bef044f45ad | 279 | * Get the temperature in raw format. |
gltest26 | 1:9bef044f45ad | 280 | * |
gltest26 | 1:9bef044f45ad | 281 | * @return The temperature in raw 16bit integer. |
gltest26 | 1:9bef044f45ad | 282 | */ |
gltest26 | 4:155c44407af5 | 283 | int getRawTemperature(void){ return getWord(TEMP_OUT_H_REG); } |
gltest26 | 1:9bef044f45ad | 284 | |
gltest26 | 1:9bef044f45ad | 285 | /** |
gltest26 | 1:9bef044f45ad | 286 | * Get the temperature of the device. |
gltest26 | 1:9bef044f45ad | 287 | * |
gltest26 | 1:9bef044f45ad | 288 | * @return The temperature in degrees celsius. |
gltest26 | 1:9bef044f45ad | 289 | */ |
gltest26 | 1:9bef044f45ad | 290 | float getTemperature(void); |
gltest26 | 1:9bef044f45ad | 291 | |
gltest26 | 1:9bef044f45ad | 292 | /** |
gltest26 | 1:9bef044f45ad | 293 | * Get the output for the x-axis gyroscope. |
gltest26 | 1:9bef044f45ad | 294 | * |
gltest26 | 1:9bef044f45ad | 295 | * Typical sensitivity is 14.375 LSB/(degrees/sec). |
gltest26 | 1:9bef044f45ad | 296 | * |
gltest26 | 1:9bef044f45ad | 297 | * @return The output on the x-axis in raw ADC counts. |
gltest26 | 1:9bef044f45ad | 298 | */ |
tylerjw | 12:d624e9c6dae7 | 299 | int getX(void){ return getWord(GYRO_XOUT_H_REG); } |
gltest26 | 1:9bef044f45ad | 300 | |
gltest26 | 1:9bef044f45ad | 301 | /** |
gltest26 | 1:9bef044f45ad | 302 | * Get the output for the y-axis gyroscope. |
gltest26 | 1:9bef044f45ad | 303 | * |
gltest26 | 1:9bef044f45ad | 304 | * Typical sensitivity is 14.375 LSB/(degrees/sec). |
gltest26 | 1:9bef044f45ad | 305 | * |
gltest26 | 1:9bef044f45ad | 306 | * @return The output on the y-axis in raw ADC counts. |
gltest26 | 1:9bef044f45ad | 307 | */ |
tylerjw | 12:d624e9c6dae7 | 308 | int getY(void){ return getWord(GYRO_YOUT_H_REG); } |
gltest26 | 1:9bef044f45ad | 309 | |
gltest26 | 1:9bef044f45ad | 310 | /** |
gltest26 | 1:9bef044f45ad | 311 | * Get the output on the z-axis gyroscope. |
gltest26 | 1:9bef044f45ad | 312 | * |
gltest26 | 1:9bef044f45ad | 313 | * Typical sensitivity is 14.375 LSB/(degrees/sec). |
gltest26 | 1:9bef044f45ad | 314 | * |
gltest26 | 1:9bef044f45ad | 315 | * @return The output on the z-axis in raw ADC counts. |
gltest26 | 1:9bef044f45ad | 316 | */ |
tylerjw | 12:d624e9c6dae7 | 317 | int getZ(void){ return getWord(GYRO_ZOUT_H_REG); } |
gltest26 | 1:9bef044f45ad | 318 | |
gltest26 | 1:9bef044f45ad | 319 | /** |
gltest26 | 1:9bef044f45ad | 320 | * Burst read the outputs on the x,y,z-axis gyroscope. |
gltest26 | 1:9bef044f45ad | 321 | * |
gltest26 | 1:9bef044f45ad | 322 | * Typical sensitivity is 14.375 LSB/(degrees/sec). |
gltest26 | 1:9bef044f45ad | 323 | * |
gltest26 | 1:9bef044f45ad | 324 | * @param readings The output buffer array that has at least 3 length. |
gltest26 | 9:05396b551a9a | 325 | * @param corr Correction method for returned values. |
gltest26 | 1:9bef044f45ad | 326 | */ |
tylerjw | 12:d624e9c6dae7 | 327 | void getXYZ(int16_t readings[3], Correction corr = OffsetCorrection); |
gltest26 | 1:9bef044f45ad | 328 | |
gltest26 | 1:9bef044f45ad | 329 | /** |
gltest26 | 1:9bef044f45ad | 330 | * Burst read the outputs on the x,y,z-axis gyroscope and convert them into degrees per second. |
gltest26 | 1:9bef044f45ad | 331 | * |
gltest26 | 1:9bef044f45ad | 332 | * @param readings The output buffer array that has at least 3 length. |
gltest26 | 9:05396b551a9a | 333 | * @param corr Correction method for returned values. |
gltest26 | 1:9bef044f45ad | 334 | */ |
tylerjw | 12:d624e9c6dae7 | 335 | void getXYZDegrees(double readings[3], Correction corr = OffsetCorrection); |
gltest26 | 1:9bef044f45ad | 336 | |
gltest26 | 1:9bef044f45ad | 337 | /** |
gltest26 | 1:9bef044f45ad | 338 | * Burst read the outputs on the x,y,z-axis gyroscope and convert them into degrees per second. |
gltest26 | 1:9bef044f45ad | 339 | * |
gltest26 | 1:9bef044f45ad | 340 | * @param readings The output buffer array that has at least 3 length. |
gltest26 | 9:05396b551a9a | 341 | * @param corr Correction method for returned values. |
gltest26 | 1:9bef044f45ad | 342 | */ |
tylerjw | 12:d624e9c6dae7 | 343 | void getXYZRadians(double readings[3], Correction corr = OffsetCorrection); |
gltest26 | 1:9bef044f45ad | 344 | |
gltest26 | 1:9bef044f45ad | 345 | /** |
gltest26 | 1:9bef044f45ad | 346 | * Get the power management configuration. |
gltest26 | 1:9bef044f45ad | 347 | * |
gltest26 | 1:9bef044f45ad | 348 | * See the datasheet for register contents details. |
gltest26 | 1:9bef044f45ad | 349 | * |
gltest26 | 1:9bef044f45ad | 350 | * 7 6 5 4 |
gltest26 | 1:9bef044f45ad | 351 | * +---------+-------+---------+---------+ |
gltest26 | 1:9bef044f45ad | 352 | * | H_RESET | SLEEP | STBY_XG | STBY_YG | |
gltest26 | 1:9bef044f45ad | 353 | * +---------+-------+---------+---------+ |
gltest26 | 1:9bef044f45ad | 354 | * |
gltest26 | 1:9bef044f45ad | 355 | * 3 2 1 0 |
gltest26 | 1:9bef044f45ad | 356 | * +---------+----------+----------+----------+ |
gltest26 | 1:9bef044f45ad | 357 | * | STBY_ZG | CLK_SEL2 | CLK_SEL1 | CLK_SEL0 | |
gltest26 | 1:9bef044f45ad | 358 | * +---------+----------+----------+----------+ |
gltest26 | 1:9bef044f45ad | 359 | * |
gltest26 | 1:9bef044f45ad | 360 | * H_RESET Reset device and internal registers to the power-up-default settings. |
gltest26 | 1:9bef044f45ad | 361 | * SLEEP Enable low power sleep mode. |
gltest26 | 1:9bef044f45ad | 362 | * STBY_XG Put gyro X in standby mode (1=standby, 0=normal). |
gltest26 | 1:9bef044f45ad | 363 | * STBY_YG Put gyro Y in standby mode (1=standby, 0=normal). |
gltest26 | 1:9bef044f45ad | 364 | * STBY_ZG Put gyro Z in standby mode (1=standby, 0=normal). |
gltest26 | 1:9bef044f45ad | 365 | * CLK_SEL Select device clock source: |
gltest26 | 1:9bef044f45ad | 366 | * |
gltest26 | 1:9bef044f45ad | 367 | * CLK_SEL | Clock Source |
gltest26 | 1:9bef044f45ad | 368 | * --------+-------------- |
gltest26 | 1:9bef044f45ad | 369 | * 0 Internal oscillator |
gltest26 | 1:9bef044f45ad | 370 | * 1 PLL with X Gyro reference |
gltest26 | 1:9bef044f45ad | 371 | * 2 PLL with Y Gyro reference |
gltest26 | 1:9bef044f45ad | 372 | * 3 PLL with Z Gyro reference |
gltest26 | 1:9bef044f45ad | 373 | * 4 PLL with external 32.768kHz reference |
gltest26 | 1:9bef044f45ad | 374 | * 5 PLL with external 19.2MHz reference |
gltest26 | 1:9bef044f45ad | 375 | * 6 Reserved |
gltest26 | 1:9bef044f45ad | 376 | * 7 Reserved |
gltest26 | 1:9bef044f45ad | 377 | * |
gltest26 | 1:9bef044f45ad | 378 | * @return The contents of the PWR_MGM register. |
gltest26 | 1:9bef044f45ad | 379 | */ |
gltest26 | 1:9bef044f45ad | 380 | char getPowerManagement(void); |
gltest26 | 1:9bef044f45ad | 381 | |
gltest26 | 1:9bef044f45ad | 382 | /** |
gltest26 | 1:9bef044f45ad | 383 | * Set power management configuration. |
gltest26 | 1:9bef044f45ad | 384 | * |
gltest26 | 1:9bef044f45ad | 385 | * See the datasheet for configuration byte details |
gltest26 | 1:9bef044f45ad | 386 | * |
gltest26 | 1:9bef044f45ad | 387 | * 7 6 5 4 |
gltest26 | 1:9bef044f45ad | 388 | * +---------+-------+---------+---------+ |
gltest26 | 1:9bef044f45ad | 389 | * | H_RESET | SLEEP | STBY_XG | STBY_YG | |
gltest26 | 1:9bef044f45ad | 390 | * +---------+-------+---------+---------+ |
gltest26 | 1:9bef044f45ad | 391 | * |
gltest26 | 1:9bef044f45ad | 392 | * 3 2 1 0 |
gltest26 | 1:9bef044f45ad | 393 | * +---------+----------+----------+----------+ |
gltest26 | 1:9bef044f45ad | 394 | * | STBY_ZG | CLK_SEL2 | CLK_SEL1 | CLK_SEL0 | |
gltest26 | 1:9bef044f45ad | 395 | * +---------+----------+----------+----------+ |
gltest26 | 1:9bef044f45ad | 396 | * |
gltest26 | 1:9bef044f45ad | 397 | * H_RESET Reset device and internal registers to the power-up-default settings. |
gltest26 | 1:9bef044f45ad | 398 | * SLEEP Enable low power sleep mode. |
gltest26 | 1:9bef044f45ad | 399 | * STBY_XG Put gyro X in standby mode (1=standby, 0=normal). |
gltest26 | 1:9bef044f45ad | 400 | * STBY_YG Put gyro Y in standby mode (1=standby, 0=normal). |
gltest26 | 1:9bef044f45ad | 401 | * STBY_ZG Put gyro Z in standby mode (1=standby, 0=normal). |
gltest26 | 1:9bef044f45ad | 402 | * CLK_SEL Select device clock source: |
gltest26 | 1:9bef044f45ad | 403 | * |
gltest26 | 1:9bef044f45ad | 404 | * CLK_SEL | Clock Source |
gltest26 | 1:9bef044f45ad | 405 | * --------+-------------- |
gltest26 | 1:9bef044f45ad | 406 | * 0 Internal oscillator |
gltest26 | 1:9bef044f45ad | 407 | * 1 PLL with X Gyro reference |
gltest26 | 1:9bef044f45ad | 408 | * 2 PLL with Y Gyro reference |
gltest26 | 1:9bef044f45ad | 409 | * 3 PLL with Z Gyro reference |
gltest26 | 1:9bef044f45ad | 410 | * 4 PLL with external 32.768kHz reference |
gltest26 | 1:9bef044f45ad | 411 | * 5 PLL with external 19.2MHz reference |
gltest26 | 1:9bef044f45ad | 412 | * 6 Reserved |
gltest26 | 1:9bef044f45ad | 413 | * 7 Reserved |
gltest26 | 1:9bef044f45ad | 414 | * |
gltest26 | 1:9bef044f45ad | 415 | * @param config The configuration byte to write to the PWR_MGM register. |
gltest26 | 1:9bef044f45ad | 416 | */ |
gltest26 | 1:9bef044f45ad | 417 | void setPowerManagement(char config); |
gltest26 | 3:eea9733ca427 | 418 | |
gltest26 | 3:eea9733ca427 | 419 | /** |
gltest26 | 3:eea9733ca427 | 420 | * Calibrate the sensor drift by sampling zero offset. |
gltest26 | 3:eea9733ca427 | 421 | * |
gltest26 | 3:eea9733ca427 | 422 | * Be sure to keep the sensor stationary while sampling offset. |
gltest26 | 3:eea9733ca427 | 423 | * |
tylerjw | 12:d624e9c6dae7 | 424 | * Once this function is invoked, following getXYZ*() functions return |
gltest26 | 3:eea9733ca427 | 425 | * corrected values. |
gltest26 | 3:eea9733ca427 | 426 | * |
gltest26 | 3:eea9733ca427 | 427 | * If the drift value changes over time, you can call this function once in a while |
gltest26 | 3:eea9733ca427 | 428 | * to follow it. But don't forget to fix the sensor while calibrating! |
gltest26 | 3:eea9733ca427 | 429 | * |
gltest26 | 3:eea9733ca427 | 430 | * @param time The time span to sample and average offset. |
gltest26 | 3:eea9733ca427 | 431 | * Sampling rate is limited, so giving long time to calibrate will improve |
gltest26 | 3:eea9733ca427 | 432 | * correction quality. |
gltest26 | 3:eea9733ca427 | 433 | */ |
gltest26 | 3:eea9733ca427 | 434 | void calibrate(double time); |
gltest26 | 6:a7ad6046824c | 435 | |
gltest26 | 6:a7ad6046824c | 436 | long getCalibrationSamples()const{ |
gltest26 | 6:a7ad6046824c | 437 | return calibSamples; |
gltest26 | 6:a7ad6046824c | 438 | } |
gltest26 | 3:eea9733ca427 | 439 | |
gltest26 | 7:43b936a53b64 | 440 | /** |
gltest26 | 7:43b936a53b64 | 441 | * Returns the I2C object that this object is using for communication. |
gltest26 | 7:43b936a53b64 | 442 | */ |
gltest26 | 7:43b936a53b64 | 443 | I2C &getI2C(){ |
gltest26 | 7:43b936a53b64 | 444 | return i2c_; |
gltest26 | 7:43b936a53b64 | 445 | } |
gltest26 | 7:43b936a53b64 | 446 | |
gltest26 | 7:43b936a53b64 | 447 | /** |
gltest26 | 7:43b936a53b64 | 448 | * Returns internal offset values for zero adjusting. Returned pointer is pointing an array of 3 elements. |
gltest26 | 7:43b936a53b64 | 449 | */ |
tylerjw | 10:33a9ed8e8988 | 450 | void getOffset(int offset_copy[3])const{ |
tylerjw | 10:33a9ed8e8988 | 451 | if(offset_copy) { |
tylerjw | 10:33a9ed8e8988 | 452 | for(int i = 0; i < 3; i++) |
tylerjw | 10:33a9ed8e8988 | 453 | offset_copy[i] = offset[i]; |
tylerjw | 10:33a9ed8e8988 | 454 | } |
gltest26 | 7:43b936a53b64 | 455 | } |
gltest26 | 7:43b936a53b64 | 456 | |
gltest26 | 3:eea9733ca427 | 457 | protected: |
gltest26 | 4:155c44407af5 | 458 | |
gltest26 | 4:155c44407af5 | 459 | /** |
gltest26 | 4:155c44407af5 | 460 | * Reads a word (2 bytes) from the sensor via I2C bus. |
gltest26 | 4:155c44407af5 | 461 | * |
gltest26 | 4:155c44407af5 | 462 | * The queried value is assumed big-endian, 2's complement value. |
gltest26 | 4:155c44407af5 | 463 | * |
tylerjw | 12:d624e9c6dae7 | 464 | * This protected function is added because we shouldn't write getX(), getY() and getZ() |
gltest26 | 4:155c44407af5 | 465 | * independently, but collect common codes. |
gltest26 | 4:155c44407af5 | 466 | * |
gltest26 | 4:155c44407af5 | 467 | * @param regi Register address to be read. |
gltest26 | 4:155c44407af5 | 468 | */ |
gltest26 | 4:155c44407af5 | 469 | int getWord(int regi); |
gltest26 | 4:155c44407af5 | 470 | |
gltest26 | 3:eea9733ca427 | 471 | /** |
gltest26 | 3:eea9733ca427 | 472 | * An internal method to acquire gyro sensor readings before calibration correction. |
gltest26 | 3:eea9733ca427 | 473 | * |
gltest26 | 3:eea9733ca427 | 474 | * Protected for the time being, although there could be cases that raw values are |
gltest26 | 3:eea9733ca427 | 475 | * appreciated by the user. |
gltest26 | 3:eea9733ca427 | 476 | */ |
tylerjw | 13:e886466d7d67 | 477 | void getRawXYZ(int16_t readings[3]); |
gltest26 | 3:eea9733ca427 | 478 | |
gltest26 | 3:eea9733ca427 | 479 | /** |
gltest26 | 3:eea9733ca427 | 480 | * Offset values that will be subtracted from output. |
gltest26 | 3:eea9733ca427 | 481 | * |
gltest26 | 3:eea9733ca427 | 482 | * TODO: temperature drift calibration |
gltest26 | 3:eea9733ca427 | 483 | */ |
gltest26 | 3:eea9733ca427 | 484 | int offset[3]; |
gltest26 | 6:a7ad6046824c | 485 | |
gltest26 | 9:05396b551a9a | 486 | float foffset[3]; |
gltest26 | 9:05396b551a9a | 487 | float slope[3]; |
gltest26 | 9:05396b551a9a | 488 | |
gltest26 | 6:a7ad6046824c | 489 | long calibSamples; |
gltest26 | 7:43b936a53b64 | 490 | |
gltest26 | 1:9bef044f45ad | 491 | private: |
gltest26 | 1:9bef044f45ad | 492 | |
gltest26 | 8:ac0365ab3cef | 493 | I2C &i2c_; |
gltest26 | 8:ac0365ab3cef | 494 | |
gltest26 | 8:ac0365ab3cef | 495 | /** |
gltest26 | 8:ac0365ab3cef | 496 | * The raw buffer for allocating I2C object in its own without heap memory. |
gltest26 | 8:ac0365ab3cef | 497 | */ |
gltest26 | 8:ac0365ab3cef | 498 | char i2cRaw[sizeof(I2C)]; |
gltest26 | 1:9bef044f45ad | 499 | |
gltest26 | 5:0a0315f0f34e | 500 | /** |
gltest26 | 5:0a0315f0f34e | 501 | * Converts big-endian 2's complement byte pair to native byte order of |
gltest26 | 5:0a0315f0f34e | 502 | * the CPU and then sign extend it to the CPU's register size. |
gltest26 | 5:0a0315f0f34e | 503 | * |
gltest26 | 5:0a0315f0f34e | 504 | * Implemented here to make the compiler inline expand it. |
gltest26 | 5:0a0315f0f34e | 505 | */ |
tylerjw | 13:e886466d7d67 | 506 | int16_t swapExtend(const char rx[2]){ |
gltest26 | 5:0a0315f0f34e | 507 | // Readings are expressed in 16bit 2's complement, so we must first |
gltest26 | 5:0a0315f0f34e | 508 | // concatenate two bytes to make a word and sign extend it to obtain |
gltest26 | 5:0a0315f0f34e | 509 | // correct negative values. |
gltest26 | 5:0a0315f0f34e | 510 | // ARMCC compiles char as unsigned, which means no sign extension is |
gltest26 | 5:0a0315f0f34e | 511 | // performed during bitwise operations to chars. But we should make sure |
gltest26 | 5:0a0315f0f34e | 512 | // that lower byte won't extend its sign past upper byte for other |
gltest26 | 5:0a0315f0f34e | 513 | // compilers if we want to keep it portable. |
gltest26 | 5:0a0315f0f34e | 514 | return int16_t(((unsigned char)rx[0] << 8) | (unsigned char)rx[1]); |
gltest26 | 5:0a0315f0f34e | 515 | } |
gltest26 | 1:9bef044f45ad | 516 | }; |
gltest26 | 1:9bef044f45ad | 517 | |
gltest26 | 1:9bef044f45ad | 518 | |
tylerjw | 12:d624e9c6dae7 | 519 | inline void ITG3200::getXYZDegrees(double readings[3], Correction corr){ |
tylerjw | 13:e886466d7d67 | 520 | int16_t intData[3]; |
tylerjw | 12:d624e9c6dae7 | 521 | getXYZ(intData, corr); |
gltest26 | 1:9bef044f45ad | 522 | for(int i = 0; i < 3; i++) |
gltest26 | 1:9bef044f45ad | 523 | readings[i] = intData[i] * 2000. / 32767.; |
gltest26 | 1:9bef044f45ad | 524 | } |
gltest26 | 1:9bef044f45ad | 525 | |
tylerjw | 12:d624e9c6dae7 | 526 | inline void ITG3200::getXYZRadians(double readings[3], Correction corr){ |
tylerjw | 13:e886466d7d67 | 527 | int16_t intData[3]; |
tylerjw | 12:d624e9c6dae7 | 528 | getXYZ(intData, corr); |
gltest26 | 1:9bef044f45ad | 529 | for(int i = 0; i < 3; i++) |
gltest26 | 1:9bef044f45ad | 530 | readings[i] = intData[i] * 2000. / 32767. * 2. * M_PI / 360.; |
gltest26 | 1:9bef044f45ad | 531 | } |
gltest26 | 1:9bef044f45ad | 532 | |
gltest26 | 1:9bef044f45ad | 533 | #endif /* ITG3200_H */ |