// Demo on how to identify and read multiple DS18B20 connected to the same bus. // Parasitic power is not used in this example. // This program is based on the sample code from Maxim/Dallas application // note 162 (http://www.maxim-ic.com/app-notes/index.mvp/id/162). Program output should look like this: *** Test with multiple DS18B20 *** Memory allocated for 20 devices. Scanning for devices... ROM CODE =62:00:00:01:CB:25:CA:28 1 ROM CODE =B6:00:00:01:CB:1B:9E:28 2 ROM CODE =66:00:00:01:CB:28:59:28 3 3 devices found. Scanning completed. Temp: 022.6875 Device: 000001CB25CA 001 Temp: 022.6875 Device: 000001CB1B9E 002 Temp: 027.6250 Device: 000001CB2859 003 Temp: 022.6250 Device: 000001CB25CA 001 Temp: 022.6875 Device: 000001CB1B9E 002 Temp: 025.3125 Device: 000001CB2859 003 Temp: 022.8125 Device: 000001CB25CA 001 Temp: 024.1875 Device: 000001CB1B9E 002 Temp: 023.7500 Device: 000001CB2859 003

Dependencies:   mbed

Files at this revision

API Documentation at this revision

Comitter:
RRacer
Date:
Thu Jan 28 09:21:44 2016 +0000
Parent:
6:16c1a0bafb2c
Commit message:
.

Changed in this revision

main.cpp Show annotated file Show diff for this revision Revisions of this file
--- a/main.cpp	Thu Jan 28 09:16:06 2016 +0000
+++ b/main.cpp	Thu Jan 28 09:21:44 2016 +0000
@@ -14,7 +14,8 @@
 // ROM CODE =62:00:00:01:CB:25:CA:28 1
 // ROM CODE =B6:00:00:01:CB:1B:9E:28 2
 // ROM CODE =66:00:00:01:CB:28:59:28 3
-// 3 devices found. Scanning completed.
+// 3 devices found.
+// Scanning completed.
 // Temp: 022.6875 Device: 000001CB25CA 001
 // Temp: 022.6875 Device: 000001CB1B9E 002
 // Temp: 027.6250 Device: 000001CB2859 003
@@ -27,7 +28,8 @@
 //////////////////////////////////////////////////////////////////////////////
 //////////////////////////////////////////////////////////////////////////////
 // I have found that adding a small capacitor (100 nF or so) over the supply
-// lines on long cable runs significantly reduces the number of bad readings.
+// lines on each device on long cable runs significantly reduces the number of
+// bad readings.
 // If you make temperature conversions more often than every 4-5 seconds, the
 // device(s) will self heat and produce a higher temperature reading.
 //////////////////////////////////////////////////////////////////////////////